- very low-energy electron diffraction
- Semiconductors: VLEED
Универсальный русско-английский словарь. Академик.ру. 2011.
very low-energy electron diffraction
Смотреть что такое "very low-energy electron diffraction" в других словарях:
Low-energy electron diffraction — (LEED) is a technique used to characterize the structures of surfaces.History =Davisson and Germer s discovery of electron diffraction= The development of electron diffraction was closely linked to the progress of quantum mechanics and atomic… … Wikipedia
Low-energy electron microscopy — Low energy electron microscopy, or LEEM, is a technique used by surface scientists to study surface structure at mesoscopic scale on conducting and semiconducting materials. It is based on imaging the electrons elastically scattered from the… … Wikipedia
Reflection high energy electron diffraction — (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that rely also… … Wikipedia
Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the … Wikipedia
Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… … Wikipedia
Electron microscope — Diagram of a transmission electron microscope A 197 … Wikipedia
Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… … Wikipedia
Energy-dispersive X-ray spectroscopy — (EDS, EDX or EDXRF) is an analytical technique used for the elemental analysis or chemical characterization of a sample. As a type of spectroscopy, it relies on the investigation of a sample through interactions between electromagnetic radiation… … Wikipedia
Electron beam induced deposition — (EBID) is a process of decomposing gaseous molecules by electron beam leading to deposition of non volatile fragments onto a nearby substrate. Process Focused electron beam of scanning electron microscope (SEM) or scanning transmission electron… … Wikipedia
Electron backscatter diffraction — An electron backscatter diffraction pattern An electron backscatter diffraction pattern of monocrystalline silicon, taken … Wikipedia
Electron microprobe — An electron microprobe (EMP), also known as an electron probe microanalyser (EPMA) is an analytical tool used to non destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron… … Wikipedia
